38. *T. Iamsasri, J. Guerrier, G. Esteves, C. Fancher, A. Wilson, R. Smith, E. Paisley, R. Johnson-Wilke, J. Ihlefeld, N. Bassiri-Gharb and J. Jones, “A Bayesian Approach to Modeling Diffraction Profiles and Application to Ferroelectric Materials,” Journal of Applied Crystallography, 50, 211 (2017)
39. *C.M. Fancher, S. Brewer, C.C. Chung, S. Röhrig, T. Rojac, G. Esteves, M. Deluca, N. Bassiri-Gharb, and J.L. Jones, “The Contribution of 180° Domain Wall Motion to Dielectric Properties Quantified from in situ X-Ray Diffraction,” Acta Materialia, 126, 36 (2017)
40. *S. J. Brewer, Cory D. Cress, S. C. Williams, H. Zhou, M. Rivas, R. Q. Rudy, R. G. Polcawich, E. R. Glaser, J. L. Jones, and N. Bassiri-Gharb, “Phenomenological Model for Defect Interactions in Irradiated Functional Materials,” Nature: Scientific Reports, 7, 5308, (2017)
41. *R. Rudy, K. Grove, M. Rivas, J. Guerrier, C. Cress, R. Benoit, J. L. Jones, E. Glaser, S. Brewer, N. Bassiri Gharb, and R. Polcawich, “Total Ionizing Dose Effects on Piezoelectric Thin-Film Cantilevers with Oxide Electrodes,” Transactions of Ultrasonics, Ferroelectrics and Frequency Control, 64, 1135, (2017)
42. *S. J. Brewer, H. Zhou, S. C. Williams, R. Q. Rudy, M. Rivas, R. G. Polcawich, C. D. Cress, E. R. Glaser, E. A. Paisley, J. F. Ihlefeld, J. L. Jones, and N. Bassiri-Gharb, “Effect of Grain Morphology on Radiation-Induced Degradation of Functional Response in Ferroelectric Thin Films,” Journal of Applied, 121, 244102, (2017)
43. *S. J. Brewer, S. C. Williams, L. A. Griffin, C. D. Cress, M. Rivas, R. Q. Rudy, R. G. Polcawich, E. R. Glaser, and N. Bassiri-Gharb, “Enhanced radiation tolerance in Mn-doped ferroelectric thin films,” Applied Physics Letters, 111 (2), 022906, (2017)
44. *S. J. Brewer, S. C. Williams, C. Z. Deng, A. B. Naden, S. M. Neumayer, B. J. Rodriguez, A. Kumar, and N. Bassiri-Gharb, “Functional and Structural Effects of Layer Periodicity in Chemical Solution-Deposited Pb(Zr,Ti)O3 Thin Films,” Journal of the American Ceramic Society, DOI: 10.1111/jace.15057, (2017)
45. *S. J. Brewer, S. C. Williams, C. Cress, and N. Bassiri-Gharb, “Effects of Crystallization Interfaces on Irradiated Ferroelectric Thin Films,” Applied Physics Letters, 111, 212905, (2017)
39. *C.M. Fancher, S. Brewer, C.C. Chung, S. Röhrig, T. Rojac, G. Esteves, M. Deluca, N. Bassiri-Gharb, and J.L. Jones, “The Contribution of 180° Domain Wall Motion to Dielectric Properties Quantified from in situ X-Ray Diffraction,” Acta Materialia, 126, 36 (2017)
40. *S. J. Brewer, Cory D. Cress, S. C. Williams, H. Zhou, M. Rivas, R. Q. Rudy, R. G. Polcawich, E. R. Glaser, J. L. Jones, and N. Bassiri-Gharb, “Phenomenological Model for Defect Interactions in Irradiated Functional Materials,” Nature: Scientific Reports, 7, 5308, (2017)
41. *R. Rudy, K. Grove, M. Rivas, J. Guerrier, C. Cress, R. Benoit, J. L. Jones, E. Glaser, S. Brewer, N. Bassiri Gharb, and R. Polcawich, “Total Ionizing Dose Effects on Piezoelectric Thin-Film Cantilevers with Oxide Electrodes,” Transactions of Ultrasonics, Ferroelectrics and Frequency Control, 64, 1135, (2017)
42. *S. J. Brewer, H. Zhou, S. C. Williams, R. Q. Rudy, M. Rivas, R. G. Polcawich, C. D. Cress, E. R. Glaser, E. A. Paisley, J. F. Ihlefeld, J. L. Jones, and N. Bassiri-Gharb, “Effect of Grain Morphology on Radiation-Induced Degradation of Functional Response in Ferroelectric Thin Films,” Journal of Applied, 121, 244102, (2017)
43. *S. J. Brewer, S. C. Williams, L. A. Griffin, C. D. Cress, M. Rivas, R. Q. Rudy, R. G. Polcawich, E. R. Glaser, and N. Bassiri-Gharb, “Enhanced radiation tolerance in Mn-doped ferroelectric thin films,” Applied Physics Letters, 111 (2), 022906, (2017)
44. *S. J. Brewer, S. C. Williams, C. Z. Deng, A. B. Naden, S. M. Neumayer, B. J. Rodriguez, A. Kumar, and N. Bassiri-Gharb, “Functional and Structural Effects of Layer Periodicity in Chemical Solution-Deposited Pb(Zr,Ti)O3 Thin Films,” Journal of the American Ceramic Society, DOI: 10.1111/jace.15057, (2017)
45. *S. J. Brewer, S. C. Williams, C. Cress, and N. Bassiri-Gharb, “Effects of Crystallization Interfaces on Irradiated Ferroelectric Thin Films,” Applied Physics Letters, 111, 212905, (2017)
